By changing the light emitting position of the stripe light source,
multiple images suitable for detection purposes are generated in
one acquisition.
Highly reflective surface detection：Eliminate specular reflection interference and retain only useful defect information.
Defect layering：Separate the diffuse reflection layer, specular reflection
layer, and concave and convex shapes, output a variety of images, and display defects more clearly and visually.
Minor defects：Achieve ultra-high-level pixel resolution and capture tiny defects in images with a large field of view.